This research on sputtered ITO films uncovers how growth conditions affect resistivity, emphasizing the need for uniform ...

The R50 can be configured as either a contact four-point probe (4PP) or non-contact eddy current (EC) probe mapper of sheet resistance, resistivity, thin film and metal film thickness, substrate ...

The Software controller automatically steps to each position and records the X-Y position, Sheet Resistance, Resistivity and V/I measurement in a visible table.

resistivity and dopant shape, oxide thickness, sheet resistance, profile shape, transition width, junction depth, electrically activated dose, and GaAs and other compound semiconductors. Through ...